Photon-assisted oxygen diffusion and oxygen-related traps in organic semiconductors

Hikmet Najafov, Daniel Mastrogiovanni, Eric Garfunkel, Leonard C. Feldman, Vitaly Podzorov

Research output: Contribution to journalArticle

37 Scopus citations

Abstract

A highly sensitive trap characterization technique based on wavelength- and polarization-resolved photocurrent excitation spectroscopy of single crystalline organic semiconductors is described. The method reveals that even a brief illumination of organic molecular crystals in an oxygen atmosphere triggers a long-term oxygen diffusion in the dark that results in formation of traps at depth scales comparable to the light penetration length.

Original languageEnglish (US)
Pages (from-to)981-985
Number of pages5
JournalAdvanced Materials
Volume23
Issue number8
DOIs
StatePublished - Feb 22 2011

    Fingerprint

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering

Keywords

  • charge transport
  • organic field-effect transistors
  • organic semiconductors
  • oxygen diffusion
  • photoconductivity

Cite this