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Point/line correspondence under 2D projective transformation

  • Peter Meer
  • , Isaac Weiss

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The projective correspondence between planar point/line sets is determined using conic invariants. In each set six (4+2) randomly chosen points/lines define two conics to which two absolute projective invariants can be associated. Similar invariant values yield six-tuples matched between the sets. The order of features on a conic is not important and thus the probability of finding a match is maximized. Feature correspondence is recovered with a dynamic programming type analysis of the contingency table derived from the ensemble of matched six-tuples. The algorithm is very sensitive to feature accuracy, raising questions about the straightforward use of conic invariants in recognition of arbitrary objects. The employed new procedures, affine invariant conic fitting to noisy data, probabilistic two-stage matching, however, are of general interest.

Original languageEnglish (US)
Title of host publicationConference A
Subtitle of host publicationComputer Vision and Applications
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages399-402
Number of pages4
ISBN (Print)081862910X
DOIs
StatePublished - 1992
Event11th IAPR International Conference on Pattern Recognition, IAPR 1992 - The Hague, Netherlands
Duration: Aug 30 1992Sep 3 1992

Publication series

NameProceedings - International Conference on Pattern Recognition
Volume1
ISSN (Print)1051-4651

Other

Other11th IAPR International Conference on Pattern Recognition, IAPR 1992
Country/TerritoryNetherlands
CityThe Hague
Period8/30/929/3/92

All Science Journal Classification (ASJC) codes

  • Computer Vision and Pattern Recognition

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