TY - GEN
T1 - Point/line correspondence under 2D projective transformation
AU - Meer, Peter
AU - Weiss, Isaac
N1 - Publisher Copyright:
© 1992 IEEE.
PY - 1992
Y1 - 1992
N2 - The projective correspondence between planar point/line sets is determined using conic invariants. In each set six (4+2) randomly chosen points/lines define two conics to which two absolute projective invariants can be associated. Similar invariant values yield six-tuples matched between the sets. The order of features on a conic is not important and thus the probability of finding a match is maximized. Feature correspondence is recovered with a dynamic programming type analysis of the contingency table derived from the ensemble of matched six-tuples. The algorithm is very sensitive to feature accuracy, raising questions about the straightforward use of conic invariants in recognition of arbitrary objects. The employed new procedures, affine invariant conic fitting to noisy data, probabilistic two-stage matching, however, are of general interest.
AB - The projective correspondence between planar point/line sets is determined using conic invariants. In each set six (4+2) randomly chosen points/lines define two conics to which two absolute projective invariants can be associated. Similar invariant values yield six-tuples matched between the sets. The order of features on a conic is not important and thus the probability of finding a match is maximized. Feature correspondence is recovered with a dynamic programming type analysis of the contingency table derived from the ensemble of matched six-tuples. The algorithm is very sensitive to feature accuracy, raising questions about the straightforward use of conic invariants in recognition of arbitrary objects. The employed new procedures, affine invariant conic fitting to noisy data, probabilistic two-stage matching, however, are of general interest.
UR - https://www.scopus.com/pages/publications/33749926997
UR - https://www.scopus.com/pages/publications/33749926997#tab=citedBy
U2 - 10.1109/ICPR.1992.201585
DO - 10.1109/ICPR.1992.201585
M3 - Conference contribution
AN - SCOPUS:33749926997
SN - 081862910X
T3 - Proceedings - International Conference on Pattern Recognition
SP - 399
EP - 402
BT - Conference A
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 11th IAPR International Conference on Pattern Recognition, IAPR 1992
Y2 - 30 August 1992 through 3 September 1992
ER -