Polarized resonant inelastic X-ray scattering as an ultrafine probe of excited states of La2CuO4

Abhay Shukla, Matteo Calandra, Munetaka Taguchi, Akio Kotani, György Vankó, S. W. Cheong

Research output: Contribution to journalArticlepeer-review

40 Scopus citations

Abstract

X-ray absorption is the standard method to probe the unoccupied density of states at a given edge. Here we show that polarized resonant inelastic x-ray scattering in La2CuO4 at the Cu K edge is extremely sensitive to the environment of the Cu atom and the fine structure in the Cu 4p density of states. Combined ab initio and many-body cluster calculations, used for the first time in such a context, show remarkable agreement with experiment. In particular, we identify a nonlocal effect, namely, a transition to off-site Cu 3d states.

Original languageEnglish (US)
Article number077006
JournalPhysical review letters
Volume96
Issue number7
DOIs
StatePublished - 2006

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Fingerprint

Dive into the research topics of 'Polarized resonant inelastic X-ray scattering as an ultrafine probe of excited states of La2CuO4'. Together they form a unique fingerprint.

Cite this