Probing carbon nanoparticles in CNx thin films using Raman spectroscopy

Debdulal Roy; Manish Chhowalla; Niklas Hellgren; T. W. Clyne; G. A.J. Amaratunga

doi:10.1103/PhysRevB.70.035406

Probing carbon nanoparticles in CN_x thin films using Raman spectroscopy

Debdulal Roy, Manish Chhowalla, Niklas Hellgren, T. W. Clyne, G. A.J. Amaratunga

School of Engineering, Materials Science & Engineering

Research output: Contribution to journal › Article › peer-review

51 Scopus citations

Abstract

Carbon nitride films prepared by magnetron sputtering were studied by multiwavelength Raman spectroscopy. The low/intermediate wavenumber features observed near 400 and 700 cm^-1 are addressed, and the relaxation of the Raman selection rule due to curvature of the graphene planes in the nanoparticles (similar to carbon nanoonions) embedded in CN_x thin films is invoked to explain the possible origin of the near 700 cm^-1 band. The shift in the G peak center and I_D/I_G ratio are correlated with the observed microstructural changes (published before) in order to understand the effect of nitrogenation and deposition temperature on the structure of the films.

Original language	English (US)
Article number	035406
Pages (from-to)	035406-1-035406-6
Journal	Physical Review B - Condensed Matter and Materials Physics
Volume	70
Issue number	3
DOIs	https://doi.org/10.1103/PhysRevB.70.035406
State	Published - Jul 2004

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

Access to Document

10.1103/PhysRevB.70.035406

Cite this

@article{ff8dcbd65dd54cdc890093c409361f08,

title = "Probing carbon nanoparticles in CNx thin films using Raman spectroscopy",

abstract = "Carbon nitride films prepared by magnetron sputtering were studied by multiwavelength Raman spectroscopy. The low/intermediate wavenumber features observed near 400 and 700 cm-1 are addressed, and the relaxation of the Raman selection rule due to curvature of the graphene planes in the nanoparticles (similar to carbon nanoonions) embedded in CNx thin films is invoked to explain the possible origin of the near 700 cm-1 band. The shift in the G peak center and ID/IG ratio are correlated with the observed microstructural changes (published before) in order to understand the effect of nitrogenation and deposition temperature on the structure of the films.",

author = "Debdulal Roy and Manish Chhowalla and Niklas Hellgren and Clyne, {T. W.} and Amaratunga, {G. A.J.}",

year = "2004",

month = jul,

doi = "10.1103/PhysRevB.70.035406",

language = "English (US)",

volume = "70",

pages = "035406--1--035406--6",

journal = "Physical Review B - Condensed Matter and Materials Physics",

issn = "0163-1829",

publisher = "American Physical Society",

number = "3",

}

TY - JOUR

T1 - Probing carbon nanoparticles in CNx thin films using Raman spectroscopy

AU - Roy, Debdulal

AU - Chhowalla, Manish

AU - Hellgren, Niklas

AU - Clyne, T. W.

AU - Amaratunga, G. A.J.

PY - 2004/7

Y1 - 2004/7

N2 - Carbon nitride films prepared by magnetron sputtering were studied by multiwavelength Raman spectroscopy. The low/intermediate wavenumber features observed near 400 and 700 cm-1 are addressed, and the relaxation of the Raman selection rule due to curvature of the graphene planes in the nanoparticles (similar to carbon nanoonions) embedded in CNx thin films is invoked to explain the possible origin of the near 700 cm-1 band. The shift in the G peak center and ID/IG ratio are correlated with the observed microstructural changes (published before) in order to understand the effect of nitrogenation and deposition temperature on the structure of the films.

AB - Carbon nitride films prepared by magnetron sputtering were studied by multiwavelength Raman spectroscopy. The low/intermediate wavenumber features observed near 400 and 700 cm-1 are addressed, and the relaxation of the Raman selection rule due to curvature of the graphene planes in the nanoparticles (similar to carbon nanoonions) embedded in CNx thin films is invoked to explain the possible origin of the near 700 cm-1 band. The shift in the G peak center and ID/IG ratio are correlated with the observed microstructural changes (published before) in order to understand the effect of nitrogenation and deposition temperature on the structure of the films.

UR - http://www.scopus.com/inward/record.url?scp=37649029742&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=37649029742&partnerID=8YFLogxK

U2 - 10.1103/PhysRevB.70.035406

DO - 10.1103/PhysRevB.70.035406

M3 - Article

AN - SCOPUS:37649029742

SN - 0163-1829

VL - 70

SP - 035406-1-035406-6

JO - Physical Review B - Condensed Matter and Materials Physics

JF - Physical Review B - Condensed Matter and Materials Physics

IS - 3

M1 - 035406

ER -

Probing carbon nanoparticles in CN_x thin films using Raman spectroscopy

Abstract

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Fingerprint

Cite this