Radiation damage and activation of CdZnTe by intermediate energy neutrons

L. M. Bartlett, C. M. Stahle, P. Shu, L. M. Barbier, S. D. Barthelmy, N. Gehreis, J. F. Krizmanic, P. Kurczynski, D. Palmer, A. Parsons, B. J. Teegarden, J. Tueller

Research output: Contribution to journalConference articlepeer-review

17 Scopus citations

Abstract

We exposed a CdZnTe detector to MeV neutrons from a 252Cf source and found no performance degradation for fluences below IO10 neutrons cm"2. Detector resolution did show significant degradation at higher neutron fluences. There is evidence of room temperature annealing of the radiation effects over time. Activation lines were observed and the responsible isotopes were identified by the energy and half-life of the lines. These radiation damage studies allow evaluation of the robustness of CdZnTe detectors in high neutron and radiation environments.

Original languageEnglish (US)
Pages (from-to)10-16
Number of pages7
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume2859
DOIs
StatePublished - Jul 19 1996
Externally publishedYes
EventHard X-Ray/Gamma-Ray and Neutron Optics, Sensors, and Applications 1996 - Denver, United States
Duration: Aug 4 1996Aug 9 1996

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Keywords

  • Activation
  • Annealing
  • CdZnTe
  • Neutron damage
  • Radiation damage
  • Spectroscopy

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