Radiation response of SiGe BiCMOS mixed-signal circuits intended for emerging lunar applications

Laleh Najafizadeh, Akil K. Sutton, Bongim Jun, John D. Cressler, Tuan Vo, Omeed Momeni, Mohammad Mojarradi, Chandradevi Ulaganathan, Suheng Chen, Benjamin J. Blalock, Yuan Yao, Xuefeng Yu, Foster Dai, Paul W. Marshall, Cheryl J. Marshall

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Scopus citations

Abstract

The effects of proton irradiation on the performance of key devices and mixed-signal circuits fabricated in a SiGe BiCMOS IC design platform and intended for emerging lunar missions are presented. High-voltage (HV) transistors, SiGe bandgap reference (BGR) circuits, a general-purpose high input impedance operational amplifier (op amp), and a 12-bit digital-to-analog converter (DAC) are investigated. The circuits were designed and implemented in a first-generation SiGe BiCMOS technology and were irradiated with 63 MeV protons. The degradation due to proton fluence in each device and circuit was found to be minor, suggesting that SiGe HBT BiCMOS technology could be a robust platform for building electronic com ponents intended for operation under extreme environments.

Original languageEnglish (US)
Title of host publication2007 9th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2007
DOIs
StatePublished - 2007
Externally publishedYes
Event2007 9th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2007 - Deauville, France
Duration: Sep 10 2007Sep 14 2007

Publication series

NameProceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Other

Other2007 9th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2007
Country/TerritoryFrance
CityDeauville
Period9/10/079/14/07

All Science Journal Classification (ASJC) codes

  • Radiation
  • Electrical and Electronic Engineering

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