Recent research and current issues in accelerated testing

E. A. Elsayed, Argon C.K. Chen

Research output: Contribution to journalConference articlepeer-review

12 Scopus citations


In this paper, we review the recent research and development in modeling accelerated life testing data obtained from a wide variety of test conditions. We will also discuss the developments in the degradation modeling area. General reliability models that can be used to estimate reliability at normal operating conditions will be presented. The limitations and disadvantages of the current models will be reviewed.

Original languageEnglish (US)
Pages (from-to)4704-4709
Number of pages6
JournalProceedings of the IEEE International Conference on Systems, Man and Cybernetics
StatePublished - 1998
EventProceedings of the 1998 IEEE International Conference on Systems, Man, and Cybernetics. Part 3 (of 5) - San Diego, CA, USA
Duration: Oct 11 1998Oct 14 1998

All Science Journal Classification (ASJC) codes

  • Control and Systems Engineering
  • Hardware and Architecture


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