Abstract
In this paper, we review the recent research and development in modeling accelerated life testing data obtained from a wide variety of test conditions. We will also discuss the developments in the degradation modeling area. General reliability models that can be used to estimate reliability at normal operating conditions will be presented. The limitations and disadvantages of the current models will be reviewed.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 4704-4709 |
| Number of pages | 6 |
| Journal | Proceedings of the IEEE International Conference on Systems, Man and Cybernetics |
| Volume | 5 |
| State | Published - 1998 |
| Event | Proceedings of the 1998 IEEE International Conference on Systems, Man, and Cybernetics. Part 3 (of 5) - San Diego, CA, USA Duration: Oct 11 1998 → Oct 14 1998 |
All Science Journal Classification (ASJC) codes
- Control and Systems Engineering
- Hardware and Architecture