Reliability analysis of K-out-of-N systems with partially repairable multi-state components

Hoang Pham, A. Suprasad, R. B. Misra

Research output: Contribution to journalArticlepeer-review

10 Scopus citations


In some environments the components might not fail fully, but can lead to degradation and the efficiency of the system may decreases. However, the degraded components can be restored back through a proper repair mechanism. In this paper, we present a model to perform reliability analysis of k-out-of-n systems assuming that components are subjected to three states such as good, degraded, and catastrophic failure. We also present expressions for reliability and mean time to failure (MTTF) of k-out-of-n systems. Simple reliability and MTTF expressions for the triple-modular redundant (TMR) system, and numerical examples are also presented in this study.

Original languageEnglish (US)
Pages (from-to)1407-1415
Number of pages9
JournalMicroelectronics Reliability
Issue number10
StatePublished - Oct 1996

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Safety, Risk, Reliability and Quality
  • Condensed Matter Physics
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering


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