Abstract
In some environments the components might not fail fully, but can lead to degradation and the efficiency of the system may decreases. However, the degraded components can be restored back through a proper repair mechanism. In this paper, we present a model to perform reliability analysis of k-out-of-n systems assuming that components are subjected to three states such as good, degraded, and catastrophic failure. We also present expressions for reliability and mean time to failure (MTTF) of k-out-of-n systems. Simple reliability and MTTF expressions for the triple-modular redundant (TMR) system, and numerical examples are also presented in this study.
Original language | English (US) |
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Pages (from-to) | 1407-1415 |
Number of pages | 9 |
Journal | Microelectronics Reliability |
Volume | 36 |
Issue number | 10 |
DOIs | |
State | Published - Oct 1996 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Safety, Risk, Reliability and Quality
- Condensed Matter Physics
- Surfaces, Coatings and Films
- Electrical and Electronic Engineering