Reliability analysis of tampered failure rate load-sharing k-out-of-n: G systems

Suprasad V. Amari, Krishna B. Misra, Hoang Pham

Research output: Chapter in Book/Report/Conference proceedingConference contribution

19 Citations (Scopus)

Abstract

Load-sharing systems have several practical applications. In load-sharing systems, the event of a component failure will result in a higher load, therefore inducing a higher failure rate, in each of the surviving components. This introduces failure dependency among the load-sharing components, which in turn increases the complexity in analyzing these systems. In this paper, we provide a closed-form analytical solution for the reliability of tampered failure rate (TFR) load-sharing k-out-of-n.'G systems with identical components where all surviving components share the load equally. The closed-form analytical solution provided in this paper allows efficient computations of system reliability characteristics. The solution is applicable for a wide range of failure time distributions of the components. The efficiency of the proposed solution is demonstrated through several numerical examples.

Original languageEnglish (US)
Title of host publication2006 Proceedings - 12th ISSAT International Conference on Reliability and Quality in Design
Pages30-35
Number of pages6
StatePublished - Dec 1 2006
Event12th ISSAT International Conference on Reliability and Quality in Design - Chicago, IL, United States
Duration: Aug 3 2006Aug 5 2006

Publication series

Name2006 Proceedings - 12th ISSAT International Conference on Reliability and Quality in Design

Other

Other12th ISSAT International Conference on Reliability and Quality in Design
CountryUnited States
CityChicago, IL
Period8/3/068/5/06

Fingerprint

Reliability analysis

All Science Journal Classification (ASJC) codes

  • Safety, Risk, Reliability and Quality

Cite this

Amari, S. V., Misra, K. B., & Pham, H. (2006). Reliability analysis of tampered failure rate load-sharing k-out-of-n: G systems. In 2006 Proceedings - 12th ISSAT International Conference on Reliability and Quality in Design (pp. 30-35). (2006 Proceedings - 12th ISSAT International Conference on Reliability and Quality in Design).
Amari, Suprasad V. ; Misra, Krishna B. ; Pham, Hoang. / Reliability analysis of tampered failure rate load-sharing k-out-of-n : G systems. 2006 Proceedings - 12th ISSAT International Conference on Reliability and Quality in Design. 2006. pp. 30-35 (2006 Proceedings - 12th ISSAT International Conference on Reliability and Quality in Design).
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abstract = "Load-sharing systems have several practical applications. In load-sharing systems, the event of a component failure will result in a higher load, therefore inducing a higher failure rate, in each of the surviving components. This introduces failure dependency among the load-sharing components, which in turn increases the complexity in analyzing these systems. In this paper, we provide a closed-form analytical solution for the reliability of tampered failure rate (TFR) load-sharing k-out-of-n.'G systems with identical components where all surviving components share the load equally. The closed-form analytical solution provided in this paper allows efficient computations of system reliability characteristics. The solution is applicable for a wide range of failure time distributions of the components. The efficiency of the proposed solution is demonstrated through several numerical examples.",
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Amari, SV, Misra, KB & Pham, H 2006, Reliability analysis of tampered failure rate load-sharing k-out-of-n: G systems. in 2006 Proceedings - 12th ISSAT International Conference on Reliability and Quality in Design. 2006 Proceedings - 12th ISSAT International Conference on Reliability and Quality in Design, pp. 30-35, 12th ISSAT International Conference on Reliability and Quality in Design, Chicago, IL, United States, 8/3/06.

Reliability analysis of tampered failure rate load-sharing k-out-of-n : G systems. / Amari, Suprasad V.; Misra, Krishna B.; Pham, Hoang.

2006 Proceedings - 12th ISSAT International Conference on Reliability and Quality in Design. 2006. p. 30-35 (2006 Proceedings - 12th ISSAT International Conference on Reliability and Quality in Design).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Amari SV, Misra KB, Pham H. Reliability analysis of tampered failure rate load-sharing k-out-of-n: G systems. In 2006 Proceedings - 12th ISSAT International Conference on Reliability and Quality in Design. 2006. p. 30-35. (2006 Proceedings - 12th ISSAT International Conference on Reliability and Quality in Design).