TY - GEN
T1 - Reliability and degradation modeling with random or uncertain failure threshold
AU - Peng, Wang
AU - Coit, David W.
PY - 2007
Y1 - 2007
N2 - This paper developed extensions to the existing research so that reliability assessment based on degradation modeling can address new problem domains that previously did not meet the required assumptions and modeling constraints. Degradation modeling is based on probabilistic modeling of a failure mechanism degradation path and comparison of a projected distribution to a pre-defined failure threshold. Previous approaches to this problem required that the predefined failure threshold must be considered as a fixed deterministic value, which can be problematic for several reasons. Often, the designer and producer of a part or a system have many diverse users of their products. In practice, the critical threshold value can vary appreciably among users. In this case, a probabilistic, rather than a deterministic threshold value is more appropriate. For other applications, the designer may not know with certainty what explicit level of degradation will cause a failure. In this case, specification of a range of possible threshold values is more appropriate. This also can be accommodated by considering the threshold value as a random variable with some assumed distribution to reflect the variability. New modeling approaches are presented in this paper such that this limiting assumption is no longer required. This should allow systems with more varied usage conditions and failure mechanisms to be analyzed using degradation-based reliability assessment methods.
AB - This paper developed extensions to the existing research so that reliability assessment based on degradation modeling can address new problem domains that previously did not meet the required assumptions and modeling constraints. Degradation modeling is based on probabilistic modeling of a failure mechanism degradation path and comparison of a projected distribution to a pre-defined failure threshold. Previous approaches to this problem required that the predefined failure threshold must be considered as a fixed deterministic value, which can be problematic for several reasons. Often, the designer and producer of a part or a system have many diverse users of their products. In practice, the critical threshold value can vary appreciably among users. In this case, a probabilistic, rather than a deterministic threshold value is more appropriate. For other applications, the designer may not know with certainty what explicit level of degradation will cause a failure. In this case, specification of a range of possible threshold values is more appropriate. This also can be accommodated by considering the threshold value as a random variable with some assumed distribution to reflect the variability. New modeling approaches are presented in this paper such that this limiting assumption is no longer required. This should allow systems with more varied usage conditions and failure mechanisms to be analyzed using degradation-based reliability assessment methods.
KW - Degradation modeling
KW - General path model
KW - Random failure threshold
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U2 - 10.1109/RAMS.2007.328107
DO - 10.1109/RAMS.2007.328107
M3 - Conference contribution
AN - SCOPUS:34547237743
SN - 0780397665
SN - 9780780397668
T3 - 2007 Proceedings - Annual Reliability and Maintainability Symposium, RAMS
SP - 392
EP - 397
BT - 2007 Proceedings - Annual Reliability and Maintainability Symposium, RAMS
T2 - 2007 53rd Annual Reliability and Maintainability Sympsoium, RAMS
Y2 - 22 January 2006 through 25 January 2006
ER -