Resistive and structural properties of La1.85Sr0.15Cu1-yZnyO4 films

Marta Z. Cieplak, K. Karpińska, J. Domagała, E. Dynowska, M. Berkowski, A. Malinowski, S. Guha, M. Croft, P. Lindenfeld

Research output: Contribution to journalArticlepeer-review

15 Scopus citations

Abstract

Single-phase c-axis aligned La1.85Sr0.15Cu1-yZnyO4 films were grown by pulsed laser deposition with Zn contents up to a value of y of 0.12. The film properties indicate the existence of defects, in addition to the Zn impurities, that are unintentionally introduced during the film growth. These defects are probably oxygen vacancies, and have a distinctly different effect on Tc from the Zn. The separation of the two effects resolves earlier ambiguities in the observed rates of Tc depression.

Original languageEnglish (US)
Pages (from-to)2823-2825
Number of pages3
JournalApplied Physics Letters
Volume73
Issue number19
DOIs
StatePublished - 1998

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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