Resistive and structural properties of La1.85Sr0.15Cu1-yZnyO4 films

Marta Z. Cieplak; K. Karpińska; J. Domagała; E. Dynowska; M. Berkowski; A. Malinowski; S. Guha; M. Croft; P. Lindenfeld

doi:10.1063/1.122602

Resistive and structural properties of La_1.85Sr_0.15Cu_1-yZn_yO₄ films

Marta Z. Cieplak, K. Karpińska, J. Domagała, E. Dynowska, M. Berkowski, A. Malinowski, S. Guha, M. Croft, P. Lindenfeld

School of Arts and Sciences, Physics & Astronomy

Research output: Contribution to journal › Article › peer-review

15 Scopus citations

Abstract

Single-phase c-axis aligned La_1.85Sr_0.15Cu_1-yZn_yO₄ films were grown by pulsed laser deposition with Zn contents up to a value of y of 0.12. The film properties indicate the existence of defects, in addition to the Zn impurities, that are unintentionally introduced during the film growth. These defects are probably oxygen vacancies, and have a distinctly different effect on T_c from the Zn. The separation of the two effects resolves earlier ambiguities in the observed rates of T_c depression.

Original language	English (US)
Pages (from-to)	2823-2825
Number of pages	3
Journal	Applied Physics Letters
Volume	73
Issue number	19
DOIs	https://doi.org/10.1063/1.122602
State	Published - 1998

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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10.1063/1.122602

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title = "Resistive and structural properties of La1.85Sr0.15Cu1-yZnyO4 films",

abstract = "Single-phase c-axis aligned La1.85Sr0.15Cu1-yZnyO4 films were grown by pulsed laser deposition with Zn contents up to a value of y of 0.12. The film properties indicate the existence of defects, in addition to the Zn impurities, that are unintentionally introduced during the film growth. These defects are probably oxygen vacancies, and have a distinctly different effect on Tc from the Zn. The separation of the two effects resolves earlier ambiguities in the observed rates of Tc depression.",

author = "Cieplak, {Marta Z.} and K. Karpi{\'n}ska and J. Domaga{\l}a and E. Dynowska and M. Berkowski and A. Malinowski and S. Guha and M. Croft and P. Lindenfeld",

year = "1998",

doi = "10.1063/1.122602",

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T1 - Resistive and structural properties of La1.85Sr0.15Cu1-yZnyO4 films

AU - Cieplak, Marta Z.

AU - Karpińska, K.

AU - Domagała, J.

AU - Dynowska, E.

AU - Berkowski, M.

AU - Malinowski, A.

AU - Guha, S.

AU - Croft, M.

AU - Lindenfeld, P.

PY - 1998

Y1 - 1998

N2 - Single-phase c-axis aligned La1.85Sr0.15Cu1-yZnyO4 films were grown by pulsed laser deposition with Zn contents up to a value of y of 0.12. The film properties indicate the existence of defects, in addition to the Zn impurities, that are unintentionally introduced during the film growth. These defects are probably oxygen vacancies, and have a distinctly different effect on Tc from the Zn. The separation of the two effects resolves earlier ambiguities in the observed rates of Tc depression.

AB - Single-phase c-axis aligned La1.85Sr0.15Cu1-yZnyO4 films were grown by pulsed laser deposition with Zn contents up to a value of y of 0.12. The film properties indicate the existence of defects, in addition to the Zn impurities, that are unintentionally introduced during the film growth. These defects are probably oxygen vacancies, and have a distinctly different effect on Tc from the Zn. The separation of the two effects resolves earlier ambiguities in the observed rates of Tc depression.

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Resistive and structural properties of La_1.85Sr_0.15Cu_1-yZn_yO₄ films

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