Safe practices for mobility evaluation in field-effect transistors and Hall effect measurements using emerging materials

Vitaly Podzorov; Vladimir Bruevich

doi:10.1038/s41928-024-01154-8

Safe practices for mobility evaluation in field-effect transistors and Hall effect measurements using emerging materials

Vitaly Podzorov
, Vladimir Bruevich

School of Arts and Sciences, New High Energy Theory Center

Research output: Contribution to journal › Letter › peer-review

7 Scopus citations

Original language	English (US)
Pages (from-to)	266-268
Number of pages	3
Journal	Nature Electronics
Volume	7
Issue number	4
DOIs	https://doi.org/10.1038/s41928-024-01154-8
State	Published - Apr 2024

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Instrumentation
Electrical and Electronic Engineering

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10.1038/s41928-024-01154-8

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Safe practices for mobility evaluation in field-effect transistors and Hall effect measurements using emerging materials

All Science Journal Classification (ASJC) codes

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