Simultaneous topography imaging and broadband nanomechanical property mapping using atomic force microscope

Tianwei Li, Qingze Zou

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Fingerprint

Dive into the research topics of 'Simultaneous topography imaging and broadband nanomechanical property mapping using atomic force microscope'. Together they form a unique fingerprint.

Engineering & Materials Science