Software reliability models with time-dependent hazard function based on Bayesian approach

Loan Pham, Hoang Pham

Research output: Contribution to journalArticlepeer-review

44 Scopus citations

Abstract

In this paper, two models predicting mean time until next failure based on Bayesian approach are presented. Times between failures follow Weibull distributions with stochastically decreasing ordering on the hazard functions of successive failure time intervals, reflecting the tester's intent to improve the software quality with each corrective action. We apply the proposed models to actual software failure data and show they give better results under sum of square errors criteria as compared to previous Bayesian models and other existing times between failures models. Finally, we utilize likelihood ratios criterion to compare new models predictive performance.

Original languageEnglish (US)
Pages (from-to)25-35
Number of pages11
JournalIEEE Transactions on Systems, Man, and Cybernetics Part A:Systems and Humans.
Volume30
Issue number1
DOIs
StatePublished - Jan 2000

All Science Journal Classification (ASJC) codes

  • Software
  • Control and Systems Engineering
  • Human-Computer Interaction
  • Computer Science Applications
  • Electrical and Electronic Engineering

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