Keyphrases
Semiconductor Manufacturing
100%
Principal Coordinate Analysis (PCoA)
100%
Virtual Metrology
100%
Elastic Net Regularization
100%
Sparse Group
100%
Sparse Principal Component Analysis
40%
Statistical Techniques
20%
Between-group
20%
Redundancy
20%
Nonsmooth
20%
Distributed Optimization
20%
Dimensionality Reduction
20%
Reconstruction Error
20%
Alternating Direction multiplier Method
20%
Learning Representations
20%
Learning Approaches
20%
Within-group
20%
Low-dimensional Subspace
20%
Selected Features
20%
Sparsity Constraint
20%
Group Sparse
20%
Coefficient Matrix
20%
Group Sparsity
20%
Sparse Learning
20%
Sparsity Level
20%
Regularized Problem
20%
Engineering
Semiconductor Manufacturing
100%
Component Analysis
100%
Principal Components
100%
Regularization
100%
Sparsity
25%
Input Feature
25%
Optimization Technique
12%
Dimensionality
12%
Distributed Optimization
12%
Specifies
12%
Learning Approach
12%
Alternating Direction Method of Multipliers
12%
Objective Function
12%
Group Sparsity
12%
Coefficient Matrix
12%
Dimensional Subspace
12%
Computer Science
Regularization
100%
Principal Components
100%
Component Analysis
100%
Sparsity
37%
Statistical Technique
12%
Optimization Technique
12%
Interpretability
12%
Distributed Optimization
12%
Dimensionality Reduction
12%
Alternating Direction Method of Multipliers
12%
Learning Approach
12%
Objective Function
12%
Dimensional Subspace
12%
Reconstruction Error
12%
Coefficient Matrix
12%
Sparse Learning
12%
Feature Variable
12%
Economics, Econometrics and Finance
Principal Components
100%