Stress distribution and tomographic profiling with energy dispersive x-ray scattering

Mark Croft, Igor Zakharchenko, Zhong Zhong, Thomas Tsakalakos, Yuriy Gulak, Zwi Kalman, Jerome Hastings, Jingzhu Hu, Ronald Holtz, Kuntimaddi Sadananda

Research output: Contribution to journalArticle

Abstract

Two novel and potentially powerful, x-ray scattering techniques for tomographic profiling of composite materials and for profiling residual strain variation, versus depth, in a specimen are presented. The techniques utilize a high intensity/energy "white" beam synchrotron source and monitor the energy dispersive scattering from a fixed micro-volume as the specimen is scanned through it. The tomographic profiles based on the net scattered intensity and exploiting absorption coefficient/scattering-power variations, can be contrast enhanced by selectively monitoring scattering from specific crystal structures in a composite material. The strain profiling technique is shown to chronicle the detailed internal the stress variation over several mm's of steel. The initial state residual stresses, the effect of a cantilever spring imposed external stress, and their interplay in elastic/plastic deformation are discussed.

Original languageEnglish (US)
Pages (from-to)EE2.1.1-EE2.1.6
JournalMaterials Research Society Symposium - Proceedings
Volume678
Publication statusPublished - Jan 1 2001

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All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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