Stress distribution and tomographic profiling with energy dispersive x-ray scattering

Mark Croft, Igor Zakharchenko, Zhong Zhong, Thomas Tsakalakos, Yuriy Gulak, Zwi Kalman, Jerome Hastings, Jingzhu Hu, Ronald Holtz, Kuntimaddi Sadananda

Research output: Contribution to journalArticle

Abstract

Two novel and potentially powerful, x-ray scattering techniques for tomographic profiling of composite materials and for profiling residual strain variation, versus depth, in a specimen are presented. The techniques utilize a high intensity/energy "white" beam synchrotron source and monitor the energy dispersive scattering from a fixed micro-volume as the specimen is scanned through it. The tomographic profiles based on the net scattered intensity and exploiting absorption coefficient/scattering-power variations, can be contrast enhanced by selectively monitoring scattering from specific crystal structures in a composite material. The strain profiling technique is shown to chronicle the detailed internal the stress variation over several mm's of steel. The initial state residual stresses, the effect of a cantilever spring imposed external stress, and their interplay in elastic/plastic deformation are discussed.

Original languageEnglish (US)
Pages (from-to)EE2.1.1-EE2.1.6
JournalMaterials Research Society Symposium - Proceedings
Volume678
StatePublished - Jan 1 2001

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x ray scattering
stress distribution
Stress concentration
Scattering
X rays
scattering
composite materials
elastic deformation
plastic deformation
residual stress
energy
Steel
absorptivity
Composite materials
synchrotrons
Elastic deformation
Synchrotrons
steels
Residual stresses
Plastic deformation

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Croft, Mark ; Zakharchenko, Igor ; Zhong, Zhong ; Tsakalakos, Thomas ; Gulak, Yuriy ; Kalman, Zwi ; Hastings, Jerome ; Hu, Jingzhu ; Holtz, Ronald ; Sadananda, Kuntimaddi. / Stress distribution and tomographic profiling with energy dispersive x-ray scattering. In: Materials Research Society Symposium - Proceedings. 2001 ; Vol. 678. pp. EE2.1.1-EE2.1.6.
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Croft, M, Zakharchenko, I, Zhong, Z, Tsakalakos, T, Gulak, Y, Kalman, Z, Hastings, J, Hu, J, Holtz, R & Sadananda, K 2001, 'Stress distribution and tomographic profiling with energy dispersive x-ray scattering', Materials Research Society Symposium - Proceedings, vol. 678, pp. EE2.1.1-EE2.1.6.

Stress distribution and tomographic profiling with energy dispersive x-ray scattering. / Croft, Mark; Zakharchenko, Igor; Zhong, Zhong; Tsakalakos, Thomas; Gulak, Yuriy; Kalman, Zwi; Hastings, Jerome; Hu, Jingzhu; Holtz, Ronald; Sadananda, Kuntimaddi.

In: Materials Research Society Symposium - Proceedings, Vol. 678, 01.01.2001, p. EE2.1.1-EE2.1.6.

Research output: Contribution to journalArticle

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AU - Croft, Mark

AU - Zakharchenko, Igor

AU - Zhong, Zhong

AU - Tsakalakos, Thomas

AU - Gulak, Yuriy

AU - Kalman, Zwi

AU - Hastings, Jerome

AU - Hu, Jingzhu

AU - Holtz, Ronald

AU - Sadananda, Kuntimaddi

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