Abstract
Three techniques for investigating the microstructure of amorphous materials are described. These include incoherent dark field microscopy, analysis of extended fine structure on the elemental core excitations, and analysis of the elastic diffraction pattern. All of these can be implemented with a Scanning Transmission Electron Microscope, allowing comparison of complementary results obtained under similar conditions.
Original language | English (US) |
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Pages (from-to) | 525-530 |
Number of pages | 6 |
Journal | Journal of Non-Crystalline Solids |
Volume | 35-36 |
Issue number | PART 1 |
DOIs | |
State | Published - 1980 |
Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Ceramics and Composites
- Condensed Matter Physics
- Materials Chemistry