The first years of the aberration-corrected electron microscopy century

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Abstract

Aberration correction, after a 50 year incubation period of developing ideas and techniques while awaiting enabling technology, has transformed electron microscopy during the first dozen years of the 21st century. Some of the conditions that accompanied this transformation, the required complexity and its effect on the way microscopy is pursued, recent results that promise to change the field, and directions for the future are briefly described.

Original languageEnglish (US)
Pages (from-to)652-655
Number of pages4
JournalMicroscopy and Microanalysis
Volume18
Issue number4
DOIs
StatePublished - Aug 1 2012

All Science Journal Classification (ASJC) codes

  • Instrumentation

Keywords

  • EELS
  • HAADF
  • STEM
  • TEM
  • aberration correction

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