The identification of thin dielectric objects from far field or near field scattering data

Noam Zeev, Fioralba Cakoni

Research output: Contribution to journalArticle

15 Citations (Scopus)

Abstract

We consider the inverse scattering problem of determining the shape and the material properties of a thin dielectric infinite cylinder having an open arc as cross section from knowledge of the TM-polarized scattered electromagnetic field at a fixed frequency. We investigate two reconstruction approaches, namely the linear sampling method and the reciprocity gap functional method, using far field or near field data, respectively. Numerical examples are given showing the efficaciousness of our algorithms.

Original languageEnglish (US)
Pages (from-to)1024-1042
Number of pages19
JournalSIAM Journal on Applied Mathematics
Volume69
Issue number4
DOIs
StatePublished - Jan 27 2009

Fingerprint

Inverse Scattering Problem
Reciprocity
Sampling Methods
Near-field
Far Field
Material Properties
Electromagnetic fields
Electromagnetic Fields
Materials properties
Arc of a curve
Cross section
Scattering
Sampling
Numerical Examples
Knowledge
Object

All Science Journal Classification (ASJC) codes

  • Applied Mathematics

Keywords

  • Direct and inverse scattering
  • Electromagnetic scattering
  • Linear sampling method
  • Reciprocity gap functional method
  • Scattering from cracks
  • Thin dielectric objects

Cite this

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The identification of thin dielectric objects from far field or near field scattering data. / Zeev, Noam; Cakoni, Fioralba.

In: SIAM Journal on Applied Mathematics, Vol. 69, No. 4, 27.01.2009, p. 1024-1042.

Research output: Contribution to journalArticle

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