The influence of residual stress and tip geometry on the measurement of surface property using nanoindentation: Experimental study and numerical analysis

A. W. Warren, Y. B. Guo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This study focuses on the basic relationships between nanohardness, residual stress, and micro/nanostructure of precision machined surfaces of high carbon steels. A series of nanoindentation tests were conducted on the cross-sections of the precision machined surfaces with ultrafine-grains or nanostructures. It was found that the nanostructured white layer significantly increases nanohardness, while the ultrafine-grained layer only slightly increases surface hardness. Residual stress affects the load-displacement curve shape at the onset of material yielding. Nanostructure makes a significant difference on the characteristics of a load-displacement curve, while ultrafine-grained structure exerts a slight influence. The influence of residual stress on the load-displacement curve can be estimated by finite element simulation of a nanoindentation. The simulation sensitivity analysis shows that the load-displacement curves are significantly affected by residual stress.

Original languageEnglish (US)
Title of host publication2008 Proceedings of the ASME - 2nd International Conference on Integration and Commercialization of Micro and Nanosystems, MicroNano 2008
Pages323-330
Number of pages8
DOIs
StatePublished - 2008
Externally publishedYes
Event2008 ASME 2nd International Conference on Integration and Commercialization of Micro and Nanosystems, MicroNano 2008 - Kowloon, Hong Kong
Duration: Jun 3 2008Jun 5 2008

Publication series

Name2008 Proceedings of the ASME - 2nd International Conference on Integration and Commercialization of Micro and Nanosystems, MicroNano 2008

Other

Other2008 ASME 2nd International Conference on Integration and Commercialization of Micro and Nanosystems, MicroNano 2008
Country/TerritoryHong Kong
CityKowloon
Period6/3/086/5/08

All Science Journal Classification (ASJC) codes

  • Biotechnology
  • Electrical and Electronic Engineering

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