TRACE ELEMENT ANALYSIS OF ENVIRONMENTAL SAMPLES BY PIXE.

G. S. Hall, N. Roach, M. Naumann, H. Cong

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations

Abstract

Several analytical procedures for trace element analysis of environmental samples that exploit the uniqueness and diversity of the PIXE method are reported. An external 3. 5 Mev proton beam was obtained from the Rutgers Nuclear Physics Laboratory's 8 Mv Tandem FN Van de Graaff accelerator and was used to produce X rays in samples that included annual tree rings, snow, NJ groundwater, river sediments, fly ash and coal. Sample analysis time in most cases was less than 12 min and most samples required very little or no sample preparation.

Original languageEnglish (US)
Pages (from-to)431-435
Number of pages5
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume231 (B3)
Issue number1-3
StatePublished - 1983
EventPart Induced X-Ray Emiss and its Anal Appl 3, Proc of the Int Conf, 3rd - Heidelberg, W Ger
Duration: Jul 18 1983Jul 22 1983

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Instrumentation

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