TY - JOUR
T1 - TRACE ELEMENT ANALYSIS OF ENVIRONMENTAL SAMPLES BY PIXE.
AU - Hall, G. S.
AU - Roach, N.
AU - Naumann, M.
AU - Cong, H.
N1 - Funding Information:
The authorsw ould like to expresst heir appreciation :o R. Leidich, chief acceleratore ngineer,and to P. Vlahakis,a ssistante ngineerA. ppreciationi s also greatly extendedt o C. Meitzler for assistancein accelerator operationsS. peciala ppreciationis due to Dr B. Shu for helpful assistancein computerp rogramming.T his re-searchw as supportedi n part by grants from the National ScienceF oundation and Water ResourcesT. ravel to the conferencew as supportedin part by a Minority Faculty DevelopmentG rant.
PY - 1983
Y1 - 1983
N2 - Several analytical procedures for trace element analysis of environmental samples that exploit the uniqueness and diversity of the PIXE method are reported. An external 3. 5 Mev proton beam was obtained from the Rutgers Nuclear Physics Laboratory's 8 Mv Tandem FN Van de Graaff accelerator and was used to produce X rays in samples that included annual tree rings, snow, NJ groundwater, river sediments, fly ash and coal. Sample analysis time in most cases was less than 12 min and most samples required very little or no sample preparation.
AB - Several analytical procedures for trace element analysis of environmental samples that exploit the uniqueness and diversity of the PIXE method are reported. An external 3. 5 Mev proton beam was obtained from the Rutgers Nuclear Physics Laboratory's 8 Mv Tandem FN Van de Graaff accelerator and was used to produce X rays in samples that included annual tree rings, snow, NJ groundwater, river sediments, fly ash and coal. Sample analysis time in most cases was less than 12 min and most samples required very little or no sample preparation.
UR - https://www.scopus.com/pages/publications/0020738604
UR - https://www.scopus.com/pages/publications/0020738604#tab=citedBy
M3 - Conference article
AN - SCOPUS:0020738604
SN - 0168-583X
VL - 231 (B3)
SP - 431
EP - 435
JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
IS - 1-3
T2 - Part Induced X-Ray Emiss and its Anal Appl 3, Proc of the Int Conf, 3rd
Y2 - 18 July 1983 through 22 July 1983
ER -