TY - GEN
T1 - Uniform derandomization from pathetic lower bounds
AU - Allender, Eric
AU - Arvind, V.
AU - Wang, Fengming
PY - 2010
Y1 - 2010
N2 - A recurring theme in the literature on derandomization is that probabilistic algorithms can be simulated quickly by deterministic algorithms, if one can obtain impressive (i.e., superpolynomial, or even nearly-exponential) circuit size lower bounds for certain problems. In contrast to what is needed for derandomization, existing lower bounds seem rather pathetic (linear-size lower bounds for general circuits [30], nearly cubic lower bounds for formula size [23], nearly nloglogn size lower bounds for branching programs [12], n 1+cd for depth d threshold circuits [26]). Here, we present two instances where "pathetic" lower bounds of the form n 1+ε would suffice to derandomize interesting classes of probabilistic algorithms. We show: - If the word problem over S5 requires constant-depth threshold circuits of size n1+ε for some ε>0, then any language accepted by uniform polynomial-size probabilistic threshold circuits can be solved in subexponential time (and more strongly, can be accepted by a uniform family of deterministic constant-depth threshold circuits of subexponential size.) - If no constant-depth arithmetic circuits of size n1+ε can multiply a sequence of n 3-by-3 matrices, then for every constant d, black-box identity testing for depth-d arithmetic circuits with bounded individual degree can be performed in subexponential time (and even by a uniform family of deterministic constant-depth AC0 circuits of subexponential size).
AB - A recurring theme in the literature on derandomization is that probabilistic algorithms can be simulated quickly by deterministic algorithms, if one can obtain impressive (i.e., superpolynomial, or even nearly-exponential) circuit size lower bounds for certain problems. In contrast to what is needed for derandomization, existing lower bounds seem rather pathetic (linear-size lower bounds for general circuits [30], nearly cubic lower bounds for formula size [23], nearly nloglogn size lower bounds for branching programs [12], n 1+cd for depth d threshold circuits [26]). Here, we present two instances where "pathetic" lower bounds of the form n 1+ε would suffice to derandomize interesting classes of probabilistic algorithms. We show: - If the word problem over S5 requires constant-depth threshold circuits of size n1+ε for some ε>0, then any language accepted by uniform polynomial-size probabilistic threshold circuits can be solved in subexponential time (and more strongly, can be accepted by a uniform family of deterministic constant-depth threshold circuits of subexponential size.) - If no constant-depth arithmetic circuits of size n1+ε can multiply a sequence of n 3-by-3 matrices, then for every constant d, black-box identity testing for depth-d arithmetic circuits with bounded individual degree can be performed in subexponential time (and even by a uniform family of deterministic constant-depth AC0 circuits of subexponential size).
KW - Circuit Complexity
KW - Derandomization
KW - Polynomial Identity Testing
UR - http://www.scopus.com/inward/record.url?scp=78149340590&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=78149340590&partnerID=8YFLogxK
U2 - 10.1007/978-3-642-15369-3_29
DO - 10.1007/978-3-642-15369-3_29
M3 - Conference contribution
AN - SCOPUS:78149340590
SN - 3642153682
SN - 9783642153686
T3 - Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
SP - 380
EP - 393
BT - Approximation, Randomization, and Combinatorial Optimization
T2 - 13th International Workshop on Approximation Algorithms for Combinatorial Optimization Problems, APPROX 2010 and 14th International Workshop on Randomization and Computation, RANDOM 2010
Y2 - 1 September 2010 through 3 September 2010
ER -