X-ray-absorption-spectroscopy studies of transition-metal boron compounds

J. Chen, Mark Croft, Y. Jeon, X. Xu, S. A. Shaheen, F. Lu

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

L2,3-edge x-ray-absorption-spectroscopy studies of the white-line feature are used to probe the electronic structure of 4d transition-metal (T) -based materials. Results of such probes of the elements Mo to Ag are reviewed. Results of a number of binary Pd-B and ternary Rh-B compounds are interpreted in terms of the loss of d states just above EF and the formation of hybridized T-4d/B antibonding states split well above Ef.

Original languageEnglish (US)
Pages (from-to)15639-15644
Number of pages6
JournalPhysical Review B
Volume46
Issue number24
DOIs
StatePublished - Jan 1 1992

Fingerprint

boron compounds
absorption spectroscopy
transition metals
probes
x ray absorption
x ray spectroscopy
x rays
electronic structure

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics

Cite this

Chen, J. ; Croft, Mark ; Jeon, Y. ; Xu, X. ; Shaheen, S. A. ; Lu, F. / X-ray-absorption-spectroscopy studies of transition-metal boron compounds. In: Physical Review B. 1992 ; Vol. 46, No. 24. pp. 15639-15644.
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X-ray-absorption-spectroscopy studies of transition-metal boron compounds. / Chen, J.; Croft, Mark; Jeon, Y.; Xu, X.; Shaheen, S. A.; Lu, F.

In: Physical Review B, Vol. 46, No. 24, 01.01.1992, p. 15639-15644.

Research output: Contribution to journalArticle

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