X-ray DC response of a simple photoconductive detector based on CdZnTe film

Jun Tao, Haitao Xu, Yuelu Zhang, Hua Meng, Huanhuan Ji, Huang Jian, Run Xu, Linjun Wang, Yicheng Lu

Research output: Contribution to journalArticlepeer-review

8 Scopus citations


CdZnTe thin films were deposited on glass substrates by close-spaced sublimation method and then annealed in vacuum. The structure, morphology and composition are investigated by X-ray diffraction, scanning electron microscopy, energy dispersive spectroscopy, respectively. The CdZnTe film detector shows a linear X-ray response, which is about one order of magnitude lower than that of the single crystalline CdZnTe sample. The mobility and lifetime product of the CdZnTe film is estimated to be around 6.5 × 10−6cm2/V. Time dependent X-ray response shows the increase of photocurrent with time at the first 20 min for the film detector, indicating a filling of traps in the forbidden gap.

Original languageEnglish (US)
Pages (from-to)645-650
Number of pages6
JournalJournal of Materials Science: Materials in Electronics
Issue number1
StatePublished - Jan 1 2016

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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