X-ray diffraction studies of selective area grown InGaN/GaN multiple quantum wells on multi-facet GaN ridges

S. M. O'Malley, P. L. Bonanno, T. Wunderer, P. Brückner, B. Neubert, F. Scholz, A. Kazimirov, A. A. Sirenko

Research output: Contribution to journalConference articlepeer-review

2 Scopus citations

Fingerprint

Dive into the research topics of 'X-ray diffraction studies of selective area grown InGaN/GaN multiple quantum wells on multi-facet GaN ridges'. Together they form a unique fingerprint.

Physics & Astronomy