Skip to main navigation
Skip to search
Skip to main content
Rutgers, The State University of New Jersey Home
Help & FAQ
Home
Profiles
Research units
Core Facilities
Federal Grants
Research output
Search by expertise, name or affiliation
Yoffe-type moving crack in a functionally graded piezoelectric material
Chunyu Li,
G. J. Weng
School of Engineering, Mechanical & Aerospace Engineering
Research output
:
Contribution to journal
›
Article
›
peer-review
74
Scopus citations
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'Yoffe-type moving crack in a functionally graded piezoelectric material'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
Keyphrases
Electric Field (E-field)
100%
Functionally Graded piezoelectric Material
100%
Moving Crack
100%
Material Properties
66%
Electric Displacement
66%
Electric Field Intensity
66%
Electric Displacement Intensity Factor
66%
Field Intensity Factors
66%
Stress Displacement
66%
Mechanical Loading
33%
Dielectric Permittivity
33%
Fourier Transform
33%
Asymptotic Expansion
33%
Piezoelectric Constant
33%
Crack Tip
33%
Mass Density
33%
Stress Field
33%
Two-pair
33%
Constant Velocity
33%
Elastic Stiffness
33%
Electric Loading
33%
Anti-plane
33%
Dual Integral Equations
33%
Inverse Square Root
33%
Moving Velocity
33%
Stationary Crack
33%
Field Displacements
33%
Singular Stress
33%
Fredholm Integral Equation of the Second Kind
33%
Engineering
Piezoelectric Material
100%
Moving Crack
100%
Electric Field
100%
Intensity Factor
80%
Singularities
40%
Field Intensity
40%
Piezoelectric
20%
Asymptotic Expansion
20%
Dielectrics
20%
Closed Form
20%
Crack Tip
20%
Mechanical Loading
20%
Inverse Square
20%
Elastic Stiffness
20%
Square Root
20%
Stationary Crack
20%
Constant Velocity
20%
Fourier Transform
20%